UTENSIL FOR EVALUATING LENGTH MEASUREMENT ERROR IN X-RAY CT DEVICE FOR THREE-DIMENSIONAL SHAPE MEASUREMENT

In order to sufficiently capture spatial distortion specific to an X-ray CT device and evaluate the three-dimensional shape measurement accuracy of the X-ray CT device, in a utensil, by attaching support rods fixing spheres to the tip thereof and having different lengths to a base spheres are arrang...

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Bibliographic Details
Main Authors ABE, Makoto, FUJIMOTO, Hiroyuki, TAKATSUJI, Toshiyuki, KISHI, Taketo, SATO, Makoto
Format Patent
LanguageEnglish
Published 16.09.2021
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Summary:In order to sufficiently capture spatial distortion specific to an X-ray CT device and evaluate the three-dimensional shape measurement accuracy of the X-ray CT device, in a utensil, by attaching support rods fixing spheres to the tip thereof and having different lengths to a base spheres are arranged in an XYZ space on the base. On a flat surface on the top of the base, the support rods supporting the spheres and having different lengths are arranged at predetermined intervals. In doing so, the spheres are arranged in the XYZ space respectively at appropriate inter-sphere distances.
Bibliography:Application Number: US201816485639