MULTI-GATE DEVICE AND METHOD OF FABRICATION THEREOF
A multi-gate semiconductor device is formed that provides a first fin element extending from a substrate. A gate structure extends over a channel region of the first fin element. The channel region of the first fin element includes a plurality of channel semiconductor layers each surrounded by a por...
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Main Authors | , , , , , |
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Format | Patent |
Language | English |
Published |
02.09.2021
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Subjects | |
Online Access | Get full text |
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Summary: | A multi-gate semiconductor device is formed that provides a first fin element extending from a substrate. A gate structure extends over a channel region of the first fin element. The channel region of the first fin element includes a plurality of channel semiconductor layers each surrounded by a portion of the gate structure. A source/drain region of the first fin element is adjacent the gate structure. The source/drain region includes a first semiconductor layer, a dielectric layer over the first semiconductor layer, and a second semiconductor layer over the dielectric layer. |
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Bibliography: | Application Number: US202117302987 |