Systems And Methods To Increase Sensor Robustness

An apparatus is described. The apparatus including a substrate; one or more sensors and one or more electrical circuits formed on the substrate, the one or more electrical circuits electrically coupled with at least one of the one or more sensors; and a metal layer formed over the sensors, wherein t...

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Main Authors Olsen, Clark T, Davis, Michael W, Riemer, Douglas P, Lang, Matthew S
Format Patent
LanguageEnglish
Published 12.08.2021
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Abstract An apparatus is described. The apparatus including a substrate; one or more sensors and one or more electrical circuits formed on the substrate, the one or more electrical circuits electrically coupled with at least one of the one or more sensors; and a metal layer formed over the sensors, wherein the metal layer is positioned over the one or more sensors to provide a barrier.
AbstractList An apparatus is described. The apparatus including a substrate; one or more sensors and one or more electrical circuits formed on the substrate, the one or more electrical circuits electrically coupled with at least one of the one or more sensors; and a metal layer formed over the sensors, wherein the metal layer is positioned over the one or more sensors to provide a barrier.
Author Olsen, Clark T
Lang, Matthew S
Riemer, Douglas P
Davis, Michael W
Author_xml – fullname: Olsen, Clark T
– fullname: Davis, Michael W
– fullname: Riemer, Douglas P
– fullname: Lang, Matthew S
BookMark eNrjYmDJy89L5WQwDK4sLknNLVZwzEtR8E0tychPKVYIyVfwzEsuSk0sTlUITs0rzi9SCMpPKi0uyUstLuZhYE1LzClO5YXS3AzKbq4hzh66qQX58anFBYnJqXmpJfGhwUYGRoZGJuZGhhaOhsbEqQIAFKMuAg
ContentType Patent
DBID EVB
DatabaseName esp@cenet
DatabaseTitleList
Database_xml – sequence: 1
  dbid: EVB
  name: esp@cenet
  url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
Discipline Medicine
Chemistry
Sciences
Physics
ExternalDocumentID US2021247218A1
GroupedDBID EVB
ID FETCH-epo_espacenet_US2021247218A13
IEDL.DBID EVB
IngestDate Fri Jul 19 12:43:58 EDT 2024
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language English
LinkModel DirectLink
MergedId FETCHMERGED-epo_espacenet_US2021247218A13
Notes Application Number: US202017030108
OpenAccessLink https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210812&DB=EPODOC&CC=US&NR=2021247218A1
ParticipantIDs epo_espacenet_US2021247218A1
PublicationCentury 2000
PublicationDate 20210812
PublicationDateYYYYMMDD 2021-08-12
PublicationDate_xml – month: 08
  year: 2021
  text: 20210812
  day: 12
PublicationDecade 2020
PublicationYear 2021
RelatedCompanies Hutchinson Technology Incorporated
RelatedCompanies_xml – name: Hutchinson Technology Incorporated
Score 3.3526525
Snippet An apparatus is described. The apparatus including a substrate; one or more sensors and one or more electrical circuits formed on the substrate, the one or...
SourceID epo
SourceType Open Access Repository
SubjectTerms ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS
CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS
ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
MEASURING
MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE
MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
PHYSICS
PRINTED CIRCUITS
TARIFF METERING APPARATUS
TESTING
Title Systems And Methods To Increase Sensor Robustness
URI https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210812&DB=EPODOC&locale=&CC=US&NR=2021247218A1
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1ba8IwFD6Iu75t3cYubgQ2-lbWm9o-lKG9IIOq2Hb4JsakIIxWbGV_fyehbj75mARCEvjOly85F4A36jJq5KalURslik05Qzu4dDS2dHTXNGxm9UXscDzujTL7c96dt-B7Hwsj84T-yOSIiKgV4r2W9nrz_4gVSN_K6p2usav8iFIvUBt1jPoFCUsNhl44nQQTX_V9L0vU8UyOmTbKHWeAWukEL9J94QAWfg1FXMrmkFSiKzid4nxFfQ0tXihw4e9rrylwHjdf3gqcSR_NVYWdDQ6rGzCaRONkUDASyyLQFUlLgmgXTuacJKhOyy2ZlXRX1cKa3cJrFKb-SMNVLP42vciSwyVbd9AuyoLfAxEJy3mOsGIuSrlcd52ebtG8y5GLlsj3D9A5NtPj8eEnuBRN8WpqmB1o19sdf0baremLPK1f8fSEZQ
link.rule.ids 230,309,783,888,25578,76884
linkProvider European Patent Office
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1NS8NAEB1K_ag3rYofVReU3IL5ak0OQdqkpWqTliaR3kK22YAgSWlS_PvOLqn21OsOLJuFNy9vd-YtwBO1Uqpmmi5TAyWKQVmKeTAx5TQxFUtTjVR_4b3Dnt8bR8b7ortowPe2F0b4hP4Ic0RE1BLxXol8vfo_xHJFbWX5TL9wqHgdhbYr1eoY9QsSluQO7OFs6k4dyXHsKJD8uYhpBsods49a6QB_sk3utD_8HPC-lNUuqYxO4XCG8-XVGTRY3oaWs317rQ3HXn3l3YYjUaO5LHGwxmF5DmptNE76eUo88Qh0ScKCINp5kTkjAarTYk3mBd2UFc9mF_A4GobOWMZVxH8fHUfB7pL1S2jmRc6ugHDDcpYhrFILpVymWGZP0WnWZchFCfL9NXT2zXSzP_wArXHoTeLJm_9xCyc8xE9QVa0DzWq9YXdIwRW9Fzv3C0-Dh1U
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=Systems+And+Methods+To+Increase+Sensor+Robustness&rft.inventor=Olsen%2C+Clark+T&rft.inventor=Davis%2C+Michael+W&rft.inventor=Riemer%2C+Douglas+P&rft.inventor=Lang%2C+Matthew+S&rft.date=2021-08-12&rft.externalDBID=A1&rft.externalDocID=US2021247218A1