Systems And Methods To Increase Sensor Robustness
An apparatus is described. The apparatus including a substrate; one or more sensors and one or more electrical circuits formed on the substrate, the one or more electrical circuits electrically coupled with at least one of the one or more sensors; and a metal layer formed over the sensors, wherein t...
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Main Authors | , , , |
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Format | Patent |
Language | English |
Published |
12.08.2021
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Subjects | |
Online Access | Get full text |
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Abstract | An apparatus is described. The apparatus including a substrate; one or more sensors and one or more electrical circuits formed on the substrate, the one or more electrical circuits electrically coupled with at least one of the one or more sensors; and a metal layer formed over the sensors, wherein the metal layer is positioned over the one or more sensors to provide a barrier. |
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AbstractList | An apparatus is described. The apparatus including a substrate; one or more sensors and one or more electrical circuits formed on the substrate, the one or more electrical circuits electrically coupled with at least one of the one or more sensors; and a metal layer formed over the sensors, wherein the metal layer is positioned over the one or more sensors to provide a barrier. |
Author | Olsen, Clark T Lang, Matthew S Riemer, Douglas P Davis, Michael W |
Author_xml | – fullname: Olsen, Clark T – fullname: Davis, Michael W – fullname: Riemer, Douglas P – fullname: Lang, Matthew S |
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Notes | Application Number: US202017030108 |
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RelatedCompanies | Hutchinson Technology Incorporated |
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Snippet | An apparatus is described. The apparatus including a substrate; one or more sensors and one or more electrical circuits formed on the substrate, the one or... |
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SubjectTerms | ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ELECTRICITY MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS PRINTED CIRCUITS TARIFF METERING APPARATUS TESTING |
Title | Systems And Methods To Increase Sensor Robustness |
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