IMPAIRMENT ANALYSIS SYSTEMS AND RELATED METHODS

Impairment analysis systems and related methods are disclosed. According to an aspect, an impairment analysis system includes a light source configured for directing light towards a subject. Further, the system includes a distance sensor configured for determining a location of the subject. The syst...

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Bibliographic Details
Main Authors Papp, Alexander Adam, Czajkowski, Matthew E, Prins, Willem
Format Patent
LanguageEnglish
Published 01.07.2021
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Summary:Impairment analysis systems and related methods are disclosed. According to an aspect, an impairment analysis system includes a light source configured for directing light towards a subject. Further, the system includes a distance sensor configured for determining a location of the subject. The system also includes an image capture device configured for capturing one or more images of the subject. Further, the system includes a computing device configured to control the light source to emit light in a predetermined pattern to apply light stimulus to the subject. The computing device is also configured to receive, from the distance sensor, information regarding the determined location of the subject. Further, the computing device is configured to receive, from the image capture device, the captured one or more images of the subject including one of a facial movement and position of the subject while the light stimulus is applied to the subject.
Bibliography:Application Number: US202017132319