PREDICTING ON CHIP TRANSIENT THERMAL RESPONSE IN A MULTI-CHIP SYSTEM USING AN RNN-BASED PREDICTOR

Machine assisted systems and methods for enhancing the resolution of an IC thermal profile from a system analysis are described. The methods can include generating a representation of two or more templates identifying different portions of an integrated circuit (IC); performing a thermal simulation...

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Main Authors Chang, Norman, Xia, Wenbo, Yang, En-Cih, Wen, Jimin, Pan, Hsiming, Zhu, Deqi, Li, Ying-Shiun, Kumar, Akhilesh, Chuang, Wen-Tze, Srinivasan, Karthik
Format Patent
LanguageEnglish
Published 01.07.2021
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Summary:Machine assisted systems and methods for enhancing the resolution of an IC thermal profile from a system analysis are described. The methods can include generating a representation of two or more templates identifying different portions of an integrated circuit (IC); performing a thermal simulation for each respective template of the IC based on a sequence of power patterns of tiles of the respective template; and training a neural network with a plurality of training data collected via thermal simulations performed for the templates of the IC. These systems and methods can use a machine learning predictor, that has been trained to determine a transient temperature rise across an entire IC, and then append the determined transient temperature rise to a system level thermal profile of the IC.
Bibliography:Application Number: US201916730421