SELF-TEST OF AN ASYNCHRONOUS CIRCUIT
An indication of an operating mode of an asynchronous circuit may be received. A determination may be made as to whether the operating mode of the asynchronous circuit corresponds to a self-test of the asynchronous circuit. In response to determining that the operating mode of the asynchronous circu...
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Main Author | |
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Format | Patent |
Language | English |
Published |
24.06.2021
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Subjects | |
Online Access | Get full text |
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Summary: | An indication of an operating mode of an asynchronous circuit may be received. A determination may be made as to whether the operating mode of the asynchronous circuit corresponds to a self-test of the asynchronous circuit. In response to determining that the operating mode of the asynchronous circuit corresponds to the self-test, a first clock signal may be provided to a first portion of a self-test component in a feedback path of the asynchronous circuit and a second clock signal may be provided to a second portion of the self-test component in the feedback path of the asynchronous circuit. Furthermore, a test value may be generated based on the first clock signal and the second clock signal. |
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Bibliography: | Application Number: US202017136198 |