CHARGED PARTICLE BEAM SOURCE AND A METHOD FOR ASSEMBLING A CHARGED PARTICLE BEAM SOURCE

A charged particle beam source that may include an emitter that has a tip for emitting charged particles; a socket; electrodes; a filament that is connected to the electrodes and to the emitter; electrodes for providing electrical signals to the filament; a support element that is connected to the e...

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Main Authors Eytan, Guy, Shavit, Lavy, Avneri, Israel, Yuli, Ofer, Levin, Jacob, Krivts (Krayvitz), Igor, Uziel, Yoram, Schlimoff, Natan, Asulin, Itay
Format Patent
LanguageEnglish
Published 10.06.2021
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Summary:A charged particle beam source that may include an emitter that has a tip for emitting charged particles; a socket; electrodes; a filament that is connected to the electrodes and to the emitter; electrodes for providing electrical signals to the filament; a support element that is connected to the emitter; and a support structure that comprises one or more interfaces for contacting only a part of the support element while supporting the support element.
Bibliography:Application Number: US202017110167