SYSTEMS AND METHODS FOR FUZZING WITH FEEDBACK

A system can include one or more processors and computer-readable instructions that when executed by the one or more processors, cause the one or more processors to provide a first test signal to an electronic device, monitor at least one parameter of the electronic device during a time period subse...

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Bibliographic Details
Main Authors Greve, David A, Coppa, Ryan J, Ryon, Luke E, Goetzman, Charles E
Format Patent
LanguageEnglish
Published 14.01.2021
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Summary:A system can include one or more processors and computer-readable instructions that when executed by the one or more processors, cause the one or more processors to provide a first test signal to an electronic device, monitor at least one parameter of the electronic device during a time period subsequent to the test signal being provided to the electronic device, determine, based on the at least one parameter, a detected response of the electronic device to the first test signal, determine, using a response model, an expected response of the electronic device to the first test signal, and provide a second test signal based on the detected response and the expected response to the electronic device. The system can include a communications circuit that provides the test signal and receives at least some feedback indicating the parameters, and sensors that receive at least some feedback indicating the parameters.
Bibliography:Application Number: US201916509174