METHOD FOR PREDICTING DEFECTS IN ASSEMBLY UNITS

One variation of a method for predicting manufacturing defects includes: accessing a first set of inspection images of a first set of assembly units recorded by an optical inspection station over a first period of time; generating a first set of vectors representing features extracted from the first...

Full description

Saved in:
Bibliographic Details
Main Authors Shedletsky, Anna-Katrina, Weiss, Samuel Bruce, Sukin, Isaac, Kozlov, Simon, Ulin, Ana, Okunev, Mikhail
Format Patent
LanguageEnglish
Published 22.10.2020
Subjects
CALCULATING
COMPUTING
COUNTING
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
PHYSICS
Online AccessGet full text

Cover

More Information
Summary:One variation of a method for predicting manufacturing defects includes: accessing a first set of inspection images of a first set of assembly units recorded by an optical inspection station over a first period of time; generating a first set of vectors representing features extracted from the first set of inspection images; grouping neighboring vectors in a multi-dimensional feature space into a set of vector groups; accessing a second inspection image of a second assembly recorded by the optical inspection station at a second time succeeding the first period of time; detecting a second set of features in the second inspection image; generating a second vector representing the second set of features in the multi-dimensional feature space; and, in response to the second vector deviating from the set of vector groups by more than a threshold difference, flagging the second assembly unit.
Bibliography:Application Number: US202016897227