RAMAN SPECTRUM INSPECTION APPARATUS, AND SAMPLE SECURITY INSPECTING METHOD FOR RAMAN SPECTRUM INSPECTION

• Main Authors: Zhang, Jianhong, Wang, Hongqiu, Liu, Haihui, Zuo, Jiaqian
• Format: Patent
• Language: English
• Published: 08.10.2020
• Subjects: CALCULATING; COMPUTING; COUNTING; ELECTRIC COMMUNICATION TECHNIQUE; ELECTRICITY; HANDLING RECORD CARRIERS; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; PICTORIAL COMMUNICATION, e.g. TELEVISION; PRESENTATION OF DATA; RECOGNITION OF DATA; RECORD CARRIERS; TESTING

A Raman spectrum inspection apparatus and a sample security inspecting method for Raman spectrum inspection are provided. The Raman spectrum inspection apparatus includes: an exciting light source configured to emit an exciting light to a sample; an optical device having a spectrum inspection optical path and a sample imaging optical path, wherein the spectrum inspection optical path is configured to collect a light signal from a location where the sample is irradiated by the exciting light, and the sample imaging optical path is configured to take an image of the sample; a spectrometer configured to receive a light signal from the spectrum inspection optical path, and to generate a Raman spectrum of the sample from the light signal; and a sample security decision device configured to determine security of the sample based on the image of the sample that is taken by the sample imaging optical path.