METHOD FOR ANALYZING PARTICLE ACCUMULATION ON A FILTER MEMBRANE

Methods for analyzing an accumulation of particles on a filter membrane involve analyzing comprise the particle accumulation in an optical analysis system using a light microscope, and then analyzing the particle accumulation in an SEM-EDX analysis system using a scanning electron microscope and ene...

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Bibliographic Details
Main Authors JU, James, METZGER, Johann, LEPELMEIER, Jörn
Format Patent
LanguageEnglish
Published 13.08.2020
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PERFORMING OPERATIONS
PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
PHYSICS
SEPARATION
TESTING
TRANSPORTING
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Summary:Methods for analyzing an accumulation of particles on a filter membrane involve analyzing comprise the particle accumulation in an optical analysis system using a light microscope, and then analyzing the particle accumulation in an SEM-EDX analysis system using a scanning electron microscope and energy-dispersive X-ray spectroscopy. In order to simplify and accelerate the testing of the filter membrane both in the optical analysis system and in the SEM-EDX system, the filter membrane is subject to a preparation which includes: (i) fixing the particles to the filter membrane, (ii) coating the particle accumulation with an electrically conductive coating which is produced from a conductivity solution that contains an ionic liquid, and (iii) holding the filter membrane flat or pulling the filter membrane taut.
Bibliography:Application Number: US202016787583