IDENTIFYING A DELAY ASSOCIATED WITH AN INPUT/OUTPUT INTERRUPT
In one example implementation according to an embodiment described herein, a computer-implemented method includes detecting input/output (I/O) interrupts for executing I/O operations occurring over a period of time. The method further includes calculating an I/O interrupt delay time (IIDT) for each...
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Format | Patent |
Language | English |
Published |
14.05.2020
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Abstract | In one example implementation according to an embodiment described herein, a computer-implemented method includes detecting input/output (I/O) interrupts for executing I/O operations occurring over a period of time. The method further includes calculating an I/O interrupt delay time (IIDT) for each I/O interrupt occurring during the period of time. The method further includes binning the IIDT for each I/O interrupt occurring during the period of time into one of a plurality of bins based on a value of the IIDT, each of the plurality of bins storing a count of IIDT values within a defined range. The method further includes determining a highest IIDT value. The method further includes identifying a performance degradation based at least on one of the count of IIDT values of each of the plurality of bins or the highest IIDT value. The method further includes implementing a corrective action to mitigate the performance degradation. |
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AbstractList | In one example implementation according to an embodiment described herein, a computer-implemented method includes detecting input/output (I/O) interrupts for executing I/O operations occurring over a period of time. The method further includes calculating an I/O interrupt delay time (IIDT) for each I/O interrupt occurring during the period of time. The method further includes binning the IIDT for each I/O interrupt occurring during the period of time into one of a plurality of bins based on a value of the IIDT, each of the plurality of bins storing a count of IIDT values within a defined range. The method further includes determining a highest IIDT value. The method further includes identifying a performance degradation based at least on one of the count of IIDT values of each of the plurality of bins or the highest IIDT value. The method further includes implementing a corrective action to mitigate the performance degradation. |
Author | Paveza, John Richard Yudenfriend, Harry M |
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Snippet | In one example implementation according to an embodiment described herein, a computer-implemented method includes detecting input/output (I/O) interrupts for... |
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Title | IDENTIFYING A DELAY ASSOCIATED WITH AN INPUT/OUTPUT INTERRUPT |
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