IDENTIFYING A DELAY ASSOCIATED WITH AN INPUT/OUTPUT INTERRUPT

In one example implementation according to an embodiment described herein, a computer-implemented method includes detecting input/output (I/O) interrupts for executing I/O operations occurring over a period of time. The method further includes calculating an I/O interrupt delay time (IIDT) for each...

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Bibliographic Details
Main Authors Paveza, John Richard, Yudenfriend, Harry M
Format Patent
LanguageEnglish
Published 14.05.2020
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
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Summary:In one example implementation according to an embodiment described herein, a computer-implemented method includes detecting input/output (I/O) interrupts for executing I/O operations occurring over a period of time. The method further includes calculating an I/O interrupt delay time (IIDT) for each I/O interrupt occurring during the period of time. The method further includes binning the IIDT for each I/O interrupt occurring during the period of time into one of a plurality of bins based on a value of the IIDT, each of the plurality of bins storing a count of IIDT values within a defined range. The method further includes determining a highest IIDT value. The method further includes identifying a performance degradation based at least on one of the count of IIDT values of each of the plurality of bins or the highest IIDT value. The method further includes implementing a corrective action to mitigate the performance degradation.
Bibliography:Application Number: US201816188756