Semiconductor Structures Which Include Laminates of First and Second Regions, and Methods of Forming Semiconductor Structures
Some embodiments include a semiconductor structure having a laminate which has first regions alternating with second regions. The first regions include silicon, and the second regions include germanium. Some embodiments include a method of forming a semiconductor structure. The semiconductor structu...
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Main Authors | , |
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Format | Patent |
Language | English |
Published |
27.02.2020
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Subjects | |
Online Access | Get full text |
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Summary: | Some embodiments include a semiconductor structure having a laminate which has first regions alternating with second regions. The first regions include silicon, and the second regions include germanium. Some embodiments include a method of forming a semiconductor structure. The semiconductor structure may correspond to at least a portion of an active region of a transistor. A first semiconductor material is deposited with a first deposition process. The first semiconductor material includes silicon. The first deposition process is intermittently interrupted to etch a surface of the deposited first semiconductor material and to deposit a second semiconductor material with a second deposition process. The second semiconductor material includes germanium. The semiconductor structure is at least partially crystalline. |
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Bibliography: | Application Number: US201816112372 |