Systems and Methods For Object Measurement

Systems and methods for object measurement in accordance with aspects of the disclosure are described. One embodiment of the invention includes a system including a processor, a memory in communication with the processor, an input device, and an image capture device, wherein the processor obtains im...

Full description

Saved in:
Bibliographic Details
Main Authors Elkins, Trevor Glenn, Chen, Rebecca, Gao, Kaijian, Zacharia, Giorgos C, Ko, Lauren Anne
Format Patent
LanguageEnglish
Published 27.02.2020
Subjects
CALCULATING
COMPUTING
COUNTING
HANDLING RECORD CARRIERS
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
PRESENTATION OF DATA
RECOGNITION OF DATA
RECORD CARRIERS
TESTING
Online AccessGet full text

Cover

More Information
Summary:Systems and methods for object measurement in accordance with aspects of the disclosure are described. One embodiment of the invention includes a system including a processor, a memory in communication with the processor, an input device, and an image capture device, wherein the processor obtains image data using the image capture device in response to input received from the input device indicating that image data should be captured, identifies a set of feature points within the obtained image data, completes the obtaining of the image data based on the set of feature points identified and in response to input received from the input device indicating that image data should no longer be captured, generates a model based on the set of feature points, measures the generated model with respect to a reference plane, and provides an indication of the measured size of the generated model.
Bibliography:Application Number: US201816186074