NON-CONTACT COORDINATE MEASURING MACHINE USING A NONCONTACT METROLOGY PROBE

A non-contact coordinate measuring machine includes: a noncontact metrology probe including: first and second cameras, wherein the second camera has a second field of view that overlaps a first field of view in a prime focal volume; a third camera has a third field of view that overlaps the prime fo...

Full description

Saved in:
Bibliographic Details
Main Author Gordon, Joshua A
Format Patent
LanguageEnglish
Published 27.02.2020
Subjects
CALCULATING
COMPUTING
COUNTING
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
Online AccessGet full text

Cover

More Information
Summary:A non-contact coordinate measuring machine includes: a noncontact metrology probe including: first and second cameras, wherein the second camera has a second field of view that overlaps a first field of view in a prime focal volume; a third camera has a third field of view that overlaps the prime focal volume and forms a probe focal volume; a multidimensional motion stage comprising: a machine coordinate system and motion arms that move the noncontact metrology probe in a machine coordinate system; a camera platform on which the cameras are disposed; a tracker with a world coordinate system and that determines a location of the probe focal volume in a tracker field of view, the non-contact coordinate measuring machine having the noncontact metrology probe for non-contact coordinate measurement of an object in an absence a stylus and in an absence of physical contact with the object.
Bibliography:Application Number: US201916545235