MEASUREMENT APPARATUS AND MEASUREMENT METHOD

Measurement apparatus and method for digital data acquisition. A first operation mode is provided for real-time processing of digital data having a reduced sample rate or resolution. Furthermore, a second operation mode is provided for processing the measurement signal off-line with a higher accurac...

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Bibliographic Details
Main Authors REICH, Friedrich, Bresser, Gerd
Format Patent
LanguageEnglish
Published 06.02.2020
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:Measurement apparatus and method for digital data acquisition. A first operation mode is provided for real-time processing of digital data having a reduced sample rate or resolution. Furthermore, a second operation mode is provided for processing the measurement signal off-line with a higher accuracy. In particular, the high accuracy data may be temporarily stored and analyzed upon the operation mode is changed from the real-time mode to the off-line mode.
Bibliography:Application Number: US201816051599