FEATURE PROCESSING METHOD AND FEATURE PROCESSING SYSTEM FOR MACHINE LEARNING

• Main Authors: LUO, Yuanfei, TU, Weiwei
• Format: Patent
• Language: English
• Published: 16.01.2020
• Subjects: CALCULATING; COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS; COMPUTING; COUNTING; ELECTRIC DIGITAL DATA PROCESSING; PHYSICS

Provided are a feature processing method and feature processing system for machine learning. The feature processing method includes: (A) acquiring a data record, wherein the data record comprises at least one piece of attribute information; (B) for each of the continuous features generated based on at least a some of the attribute information in the at least one piece of attribute information, executing a basic binning operation and at least one additional operation to generate a basic binning feature and at least one additional feature corresponding to each of the continuous features; and (C) generating a machine learning sample at least comprising the generated basic binning feature and at least one additional feature. By means of the above-mentioned method, a plurality of features comprising the binning feature and corresponding to the continuous features can be acquired, so as to make the features constituting the machine learning sample more effective, so as to improve the effect of a machine learning model.