SYSTEM AND METHOD FOR DETECTION OF A STRUCTURE
In an aspect of the disclosure, a method, a computer-readable medium, and an apparatus are provided. The apparatus may include an imager, an inertial measurement unit, and a processing system. The imager may be configured to capture an image. The inertial measurement unit may have an output. The pro...
Saved in:
Main Authors | , |
---|---|
Format | Patent |
Language | English |
Published |
02.01.2020
|
Subjects | |
Online Access | Get full text |
Cover
Loading…
Summary: | In an aspect of the disclosure, a method, a computer-readable medium, and an apparatus are provided. The apparatus may include an imager, an inertial measurement unit, and a processing system. The imager may be configured to capture an image. The inertial measurement unit may have an output. The processing system may be configured to collect positional information indicating a position of the computing device in response to the output from the inertial measurement unit. Further, the processing system may be configured to determine a selected structure captured in the image. Further, the processing system may be configured to identify information corresponding to the selected structure based on the positional information. |
---|---|
Bibliography: | Application Number: US201816022518 |