SURFACE PARTICIPATION ANALYSIS OF SUPERCONDUCTING QUBITS WITH THE BOUNDARY ELEMENT METHOD
Techniques regarding an autonomous surface participation analysis of one or more superconducting qubits using the boundary element method are provided. For example, one or more embodiments described herein can comprise a system, which can comprise a memory that can store computer executable componen...
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Main Author | |
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Format | Patent |
Language | English |
Published |
12.12.2019
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Subjects | |
Online Access | Get full text |
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Summary: | Techniques regarding an autonomous surface participation analysis of one or more superconducting qubits using the boundary element method are provided. For example, one or more embodiments described herein can comprise a system, which can comprise a memory that can store computer executable components. The system can also comprise a processor, operably coupled to the memory, and that can execute the computer executable components stored in the memory. The computer executable components can comprise a simulation component, operatively coupled to the processor, that can analyze a surface participation of a superconducting qubit by discretizing a conductor-dielectric interface and a dielectric-dielectric interface into a plurality of panels. |
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Bibliography: | Application Number: US201816006346 |