CROSS-POINT MEMORY AND METHODS FOR FABRICATION OF SAME

A method of fabricating a memory device is disclosed. In one aspect, the method comprises patterning a first conductive line extending in a first direction. The method additionally includes forming a free-standing pillar of a memory cell stack on the first conductive line after patterning the first...

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Bibliographic Details
Main Authors Somaschini, Roberto, Donghi, Ombretta, Ravasio, Marcello, Sciarrillo, Samuele
Format Patent
LanguageEnglish
Published 21.11.2019
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Summary:A method of fabricating a memory device is disclosed. In one aspect, the method comprises patterning a first conductive line extending in a first direction. The method additionally includes forming a free-standing pillar of a memory cell stack on the first conductive line after patterning the first conductive line. Forming the free-standing pillar includes depositing a memory cell stack comprising a selector material and a storage material over the conductive line and patterning the memory cell stack to form the free-standing pillar. The method further includes patterning a second conductive line on the pillar after patterning the memory cell stack, the second conductive line extending in a second direction crossing the first direction.
Bibliography:Application Number: US201916420483