Seed Analysis
A method of analyzing seeds including acquiring, using an X-ray machine, X-ray images of the seeds. Analyzing the X-ray images to determine a parameter of each of the seeds. Comparing a parameter determined from analyzing the X-ray image of one seed to a parameter determined from analyzing the X-ray...
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Main Authors | , |
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Format | Patent |
Language | English |
Published |
10.10.2019
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Subjects | |
Online Access | Get full text |
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Summary: | A method of analyzing seeds including acquiring, using an X-ray machine, X-ray images of the seeds. Analyzing the X-ray images to determine a parameter of each of the seeds. Comparing a parameter determined from analyzing the X-ray image of one seed to a parameter determined from analyzing the X-ray image of another seed. Arranging the seeds relative to each other based on the seed parameters. |
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Bibliography: | Application Number: US201916271005 |