Seed Analysis

A method of analyzing seeds including acquiring, using an X-ray machine, X-ray images of the seeds. Analyzing the X-ray images to determine a parameter of each of the seeds. Comparing a parameter determined from analyzing the X-ray image of one seed to a parameter determined from analyzing the X-ray...

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Bibliographic Details
Main Authors CHEN, HSINN, Kotyk, Johnny J
Format Patent
LanguageEnglish
Published 10.10.2019
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Summary:A method of analyzing seeds including acquiring, using an X-ray machine, X-ray images of the seeds. Analyzing the X-ray images to determine a parameter of each of the seeds. Comparing a parameter determined from analyzing the X-ray image of one seed to a parameter determined from analyzing the X-ray image of another seed. Arranging the seeds relative to each other based on the seed parameters.
Bibliography:Application Number: US201916271005