Twin Bit Non-volatile Memory Cells With Floating Gates In Substrate Trenches

A twin bit memory cell includes first and second spaced apart floating gates formed in first and second trenches in the upper surface of a semiconductor substrate. An erase gate, or a pair of erase gates, are disposed over and insulated from the floating gates, respectively. A word line gate is disp...

Full description

Saved in:
Bibliographic Details
Main Authors Wang, Chunming, Liu, Xian, Liu, Andy, Diao, Melvin, Xing, Leo, Do, Nhan
Format Patent
LanguageEnglish
Published 11.07.2019
Subjects
Online AccessGet full text

Cover

Loading…
More Information
Summary:A twin bit memory cell includes first and second spaced apart floating gates formed in first and second trenches in the upper surface of a semiconductor substrate. An erase gate, or a pair of erase gates, are disposed over and insulated from the floating gates, respectively. A word line gate is disposed over and insulated from a portion of the upper surface that is between the first and second trenches. A first source region is formed in the substrate under the first trench, and a second source region formed in the substrate under the second trench. A continuous channel region of the substrate extends from the first source region, along a side wall of the first trench, along the portion of the upper surface that is between the first and second trenches, along a side wall of the second trench, and to the second source region.
Bibliography:Application Number: US201816160812