HIGH RESISTIVITY SEMICONDUCTOR-ON-INSULATOR WAFER AND A METHOD OF MANUFACTURING

A semiconductor on insulator multilayer structure is provided. The multilayer comprises a high resistivity single crystal semiconductor handle substrate, an optionally relaxed semiconductor layer comprising silicon, germanium, or silicon germanium, an optional polycrystalline silicon layer, a dielec...

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Bibliographic Details
Main Authors Wang, Gang, Libbert, Jeffrey L, Fei, Lu, Usenko, Alex, Thomas, Shawn George, Jones, Andrew M, Kommu, Srikanth, Peidous, Igor
Format Patent
LanguageEnglish
Published 09.05.2019
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Summary:A semiconductor on insulator multilayer structure is provided. The multilayer comprises a high resistivity single crystal semiconductor handle substrate, an optionally relaxed semiconductor layer comprising silicon, germanium, or silicon germanium, an optional polycrystalline silicon layer, a dielectric layer, and a single crystal semiconductor device layer.
Bibliography:Application Number: US201816235305