METHOD AND SYSTEM FOR HIGH-RESOLUTION X-RAY DETECTION FOR PHASE CONTRAST X-RAY IMAGING
A phase contrast X-ray imaging system for imaging an object including an X-ray source; and an X-ray detector having a 25 micron or less pixel pitch; wherein a distance between the X-ray source and the object is less than or equal to 10 cm.
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Main Authors | , |
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Format | Patent |
Language | English |
Published |
18.04.2019
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Subjects | |
Online Access | Get full text |
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Summary: | A phase contrast X-ray imaging system for imaging an object including an X-ray source; and an X-ray detector having a 25 micron or less pixel pitch; wherein a distance between the X-ray source and the object is less than or equal to 10 cm. |
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Bibliography: | Application Number: US201816050354 |