RAMAN SPECTRUM INSPECTION APPARATUS

A Raman spectrum inspection apparatus is provided, including: a exciting light source configured to emit an exciting light to a sample to be inspected; an optical device configured to collect an optical signal from a position, which is irradiated by the exciting light, of the sample to be inspected;...

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Bibliographic Details
Main Authors ZHANG, Li, ZHANG, Jianhong, WANG, Hongqiu
Format Patent
LanguageEnglish
Published 31.01.2019
Subjects
COLORIMETRY
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT
MEASURING
PHYSICS
RADIATION PYROMETRY
TESTING
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Summary:A Raman spectrum inspection apparatus is provided, including: a exciting light source configured to emit an exciting light to a sample to be inspected; an optical device configured to collect an optical signal from a position, which is irradiated by the exciting light, of the sample to be inspected; and a spectrometer configured to generate a Raman spectrum of the sample to be inspected from the received optical signal, wherein an excitation optical path in which the exciting light passes from the exciting light device to the sample to be inspected and a detection optical path in which the optical signal received by the spectrometer passes from the sample to be inspected to the spectrometer are separated from each other.
Bibliography:Application Number: US201816043900