CHARGED PARTICLE DETECTOR, CHARGED PARTICLE BEAM DEVICE, AND MASS SPECTROMETER
The objective of the present invention is to provide a charged particle detector and a charged particle beam device with which it is possible to acquire a high luminous output while rapidly eliminating charged particles that are incident to a scintillator. In order to achieve said objective the pres...
Saved in:
Main Authors | , , , , |
---|---|
Format | Patent |
Language | English |
Published |
24.01.2019
|
Subjects | |
Online Access | Get full text |
Cover
Loading…
Summary: | The objective of the present invention is to provide a charged particle detector and a charged particle beam device with which it is possible to acquire a high luminous output while rapidly eliminating charged particles that are incident to a scintillator. In order to achieve said objective the present invention proposes: a charged particle detector provided with a light-emitting unit including a laminated structure obtained by laminating a GaInN-containing layer and a GaN layer, and provided with a conductive layer that is in contact with the GaInN-containing layer on the charged particle incidence surface side of the laminated structure; and a charged particle beam device. |
---|---|
Bibliography: | Application Number: US201716070790 |