TESTING APPARATUS

A testing apparatus for testing a device. In accordance with an embodiment the testing apparatus includes a base part; a testing head; first movement rails attached with the base part; a first movement platform positioned on top of the first movement rails adapted to enable movement of the first mov...

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Bibliographic Details
Main Authors Koljonen, Juha, Jokinen, Kimmo, Nieminen, Tuomas, Björk, Tommi
Format Patent
LanguageEnglish
Published 20.12.2018
Subjects
MEASURING
PHYSICS
TESTING
TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES
TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
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Summary:A testing apparatus for testing a device. In accordance with an embodiment the testing apparatus includes a base part; a testing head; first movement rails attached with the base part; a first movement platform positioned on top of the first movement rails adapted to enable movement of the first movement platform in a first direction; a second movement platform attached with the first movement platform so that the second movement platform is adapted to be movable in a second direction transverse to the first direction; a first support adapted to be movable in a third direction transverse to the first direction and the second direction; a movement mechanism for moving the testing head; and a second support attached with the vertical support for supporting the movement mechanism and the testing head. The movement mechanism comprises a first axis for pivoting the testing head; a second axis for tilting the testing head; and a third axes for rotating the testing head.
Bibliography:Application Number: US201715850504