ABNORMALITY DIAGNOSTIC APPARATUS

• Main Authors: SHIRAISHI, Yoshihiko, SAITOU, Keita, SAKAIDA, Atusi, TANIGUCHI, Toshihisa, GOUKO, Norio, TANAKA, Yasuhiro, HARADA, Toshikazu, MATSUI, Hirohito
• Format: Patent
• Language: English
• Published: 01.11.2018
• Subjects: CONTROL OR REGULATING SYSTEMS IN GENERAL; CONTROLLING; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; MEASURING QUANTITY OF HEAT; MEASURING TEMPERATURE; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS; PHYSICS; REGULATING; TESTING; TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR

An abnormality diagnostic apparatus includes: a heat flux sensor that detects heat flux generated by a measurement target continuously from the start of operation of the measurement target or at predetermined time intervals; and a control device that determines whether there is an abnormality based on the result of the detection by the heat flux sensor. In the event of an abnormality in a facility, heat flux generated from the facility by at least one of current, voltage, sound, vibration, and friction changes. Therefore, the use of the heat flux sensor makes it possible to determine the presence or absence of an abnormality in the measurement target without using a plurality of kinds of sensors to measure current, voltage, sound, vibration, and friction.