3D VERTICAL FET WITH TOP AND BOTTOM GATE CONTACTS
A method for forming a semiconductor device includes forming bottom side metallization structures having at least one connection to a bottom side of a vertical transistor disposed on a substrate, the bottom side metallization structures including a power rail and a ground rail. After forming the bot...
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Main Authors | , |
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Format | Patent |
Language | English |
Published |
25.10.2018
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Subjects | |
Online Access | Get full text |
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Summary: | A method for forming a semiconductor device includes forming bottom side metallization structures having at least one connection to a bottom side of a vertical transistor disposed on a substrate, the bottom side metallization structures including a power rail and a ground rail. After forming the bottom side metallization structures, the substrate is removed and the vertical transistor is flipped. Top side metallization structures are formed. The top side metallization structures having at least one connection to the vertical transistor on a top side of the vertical transistor. |
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Bibliography: | Application Number: US201816023120 |