MEASURING OPERATIONAL PARAMETERS AT THE GUIDED SURFACE WAVEGUIDE PROBE

Disclosed is an exemplary guided surface waveguide probe. In one embodiment, the guided surface waveguide probe comprises a charge terminal elevated to a height above the lossy conducting medium; a support structure that supports the charge terminal; an internal coil that is supported within the sup...

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Bibliographic Details
Main Authors Corum, James F, Corum, Kenneth L, Lomax, Jerry A, Lougheed, JR., Timothy J
Format Patent
LanguageEnglish
Published 13.09.2018
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Summary:Disclosed is an exemplary guided surface waveguide probe. In one embodiment, the guided surface waveguide probe comprises a charge terminal elevated to a height above the lossy conducting medium; a support structure that supports the charge terminal; an internal coil that is supported within the support structure and is coupled to an excitation source; a conductive tube having a first end conductively coupled to the at least one section of internal coil, wherein a second end of the conductive tube extends vertically towards and is electrically coupled to the charge terminal; at least one sensor electrically coupled to the charge terminal or the internal coil, wherein the at least one sensor measures an operational parameter of the guided surface waveguide probe; and a non-conductive channel connected to the at least one sensor by which data associated with the operational parameter is communicated.
Bibliography:Application Number: US201815909632