SYSTEM AND METHOD FOR MEASUREMENT OF TEMPERATURE ON A GUIDED SURFACE WAVEGUIDE PROBE

Disclosed are various embodiments for providing temperature measurements of a guided surface wave probe and/or a support structure. In one embodiment, among others, a system comprises a guided surface waveguide probe configured to launch a guided surface wave along a lossy conducting medium, where t...

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Bibliographic Details
Main Authors Pesavento, Philip V, Corum, James F, Salvitti, JR., James M, Corum, Kenneth L, Lomax, Jerry A
Format Patent
LanguageEnglish
Published 13.09.2018
Subjects
ANTENNAS, i.e. RADIO AERIALS
BASIC ELECTRIC ELEMENTS
BASIC ELECTRONIC CIRCUITRY
CIRCUIT ARRANGEMENTS OR SYSTEMS FOR SUPPLYING OR DISTRIBUTINGELECTRIC POWER
CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
ELECTRICITY
GENERATION
IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS
MEASURING
MEASURING QUANTITY OF HEAT
MEASURING TEMPERATURE
PHYSICS
RESONATORS
RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
SYSTEMS FOR STORING ELECTRIC ENERGY
TESTING
THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
WAVEGUIDES
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Summary:Disclosed are various embodiments for providing temperature measurements of a guided surface wave probe and/or a support structure. In one embodiment, among others, a system comprises a guided surface waveguide probe configured to launch a guided surface wave along a lossy conducting medium, where the guided surface waveguide probe generates heat while in operation. The support structure comprises non-conducting structural components that support the electrical components of the guided surface waveguide probe. The system also comprises a temperature sensor positioned on one of the non-conducting structural components.
Bibliography:Application Number: US201815906002