Semiconductor Mask Blanks with a Compatible Stop Layer
A mask for semiconductor manufacturing includes a mask substrate, a shifter layer over the mask substrate, a stop layer over and in contact with the shifter layer, and an absorber layer over the stop layer. The shifter layer includes each material of a set of materials, the materials being combined...
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Main Authors | , , , |
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Format | Patent |
Language | English |
Published |
23.08.2018
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Subjects | |
Online Access | Get full text |
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Summary: | A mask for semiconductor manufacturing includes a mask substrate, a shifter layer over the mask substrate, a stop layer over and in contact with the shifter layer, and an absorber layer over the stop layer. The shifter layer includes each material of a set of materials, the materials being combined in a first proportion in the shifter layer. The stop layer includes each material of the set of materials, the materials being combined in a second proportion in the stop layer that is different from the first proportion. |
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Bibliography: | Application Number: US201815956001 |