METHODS FOR ASSESSING SEMICONDUCTOR STRUCTURES

Methods for assessing the quality of a semiconductor structure having a charge trapping layer to, for example, determine if the structure is suitable for use as a radiofrequency device are disclosed. Embodiments of the assessing method may involve measuring an electrostatic parameter at an initial s...

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Main Authors Wang, Gang, Libbert, Jeffrey L, Rapoport, Igor, Kommu, Srikanth, Peidous, Igor
Format Patent
LanguageEnglish
Published 16.08.2018
Subjects
BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
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Abstract Methods for assessing the quality of a semiconductor structure having a charge trapping layer to, for example, determine if the structure is suitable for use as a radiofrequency device are disclosed. Embodiments of the assessing method may involve measuring an electrostatic parameter at an initial state and at an excited state in which charge carriers are generated.
AbstractList Methods for assessing the quality of a semiconductor structure having a charge trapping layer to, for example, determine if the structure is suitable for use as a radiofrequency device are disclosed. Embodiments of the assessing method may involve measuring an electrostatic parameter at an initial state and at an excited state in which charge carriers are generated.
Author Peidous, Igor
Rapoport, Igor
Wang, Gang
Libbert, Jeffrey L
Kommu, Srikanth
Author_xml – fullname: Wang, Gang
– fullname: Libbert, Jeffrey L
– fullname: Rapoport, Igor
– fullname: Kommu, Srikanth
– fullname: Peidous, Igor
BookMark eNrjYmDJy89L5WTQ83UN8fB3CVZw8w9ScAwOdg0O9vRzVwh29fV09vdzCXUOAYoHhwQBGaFBrsE8DKxpiTnFqbxQmptB2c01xNlDN7UgPz61uCAxOTUvtSQ-NNjIwNDCyNjYxMjA0dCYOFUArD4o5w
ContentType Patent
DBID EVB
DatabaseName esp@cenet
DatabaseTitleList
Database_xml – sequence: 1
  dbid: EVB
  name: esp@cenet
  url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
Discipline Medicine
Chemistry
Sciences
ExternalDocumentID US2018233420A1
GroupedDBID EVB
ID FETCH-epo_espacenet_US2018233420A13
IEDL.DBID EVB
IngestDate Fri Jul 19 12:55:43 EDT 2024
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language English
LinkModel DirectLink
MergedId FETCHMERGED-epo_espacenet_US2018233420A13
Notes Application Number: US201815893055
OpenAccessLink https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20180816&DB=EPODOC&CC=US&NR=2018233420A1
ParticipantIDs epo_espacenet_US2018233420A1
PublicationCentury 2000
PublicationDate 20180816
PublicationDateYYYYMMDD 2018-08-16
PublicationDate_xml – month: 08
  year: 2018
  text: 20180816
  day: 16
PublicationDecade 2010
PublicationYear 2018
RelatedCompanies SunEdison Semiconductor Limited (UEN201334164H)
RelatedCompanies_xml – name: SunEdison Semiconductor Limited (UEN201334164H)
Score 3.1647315
Snippet Methods for assessing the quality of a semiconductor structure having a charge trapping layer to, for example, determine if the structure is suitable for use...
SourceID epo
SourceType Open Access Repository
SubjectTerms BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
Title METHODS FOR ASSESSING SEMICONDUCTOR STRUCTURES
URI https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20180816&DB=EPODOC&locale=&CC=US&NR=2018233420A1
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3dS8MwED_GFPVNp-LHlILSt-r6sbZ7KLIlrUVoO9ZW9jaaJQVBuuEq_vteQ6d72luSg3wcXO5-yX0APLpDzmw0XDWTF45mscLWXNSSGur6EedLpnMJFKPYDnPrbT6cd-BzGwsj84T-yOSIKFFLlPda3tfr_0csKn0rN8_sA4dWL0HmUbVFx7qsI6HSiedPE5oQlRAvT9V4JmmGaVrGYIxY6QANaadxAPPfJ01cynpXqQSncDjF-ar6DDqi6sEx2dZe68FR1H55Y7OVvs05PEV-FiY0VRC5KeNU3oTxq5I2rEximpMMx9Nsho0cGXsBD4GfkVDDhRd_51zk6e4uzUvoVqtKXIFSiMLhJXeZpQurtAQrHJej5cWEMMrlaHAN_X0z3ewn38IJdg3piuz2oVt_fYs71LQ1u5cM-gUOZ33C
link.rule.ids 230,309,783,888,25578,76884
linkProvider European Patent Office
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfR3LSsNAcChVrDetio-qASW3aPNokh6CtHkYtUlKk0hvIZvdgCBpsRF_38nSak-9DTMwuzswz92dAbg3B5ToGLhKKs0NSSO5LpnoJSX09UNKCyJTnigGoe6n2ut8MG_B5-YvDO8T-sObI6JGFajvNbfXy_8ilsPfVq4eyQeiFk9eYjniOjuW-RwJ0Rlb7jRyIlu0bSuNxXDGaYqqakp_hLnSHgbZZtNp330fN_9SlttOxTuC_Snyq-pjaLGqCx17M3utCwfB-sobwbX2rU7gIXATP3JiATM3YRRzSxg-C3Ejyih0UjtBfJzMEEhRsKdw57mJ7Uu4cPZ3ziyNt3epnkG7WlTsHISc5QYtqUk0mWmlxkhumBQjL8KYUhbD_gX0dnG63E2-hY6fBJNs8hK-XcFhQ2qKprLeg3b99c2u0evW5IYL6xcdFIC9
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=METHODS+FOR+ASSESSING+SEMICONDUCTOR+STRUCTURES&rft.inventor=Wang%2C+Gang&rft.inventor=Libbert%2C+Jeffrey+L&rft.inventor=Rapoport%2C+Igor&rft.inventor=Kommu%2C+Srikanth&rft.inventor=Peidous%2C+Igor&rft.date=2018-08-16&rft.externalDBID=A1&rft.externalDocID=US2018233420A1