Chuck Systems and Methods Having Enhanced Electrical Isolation For Substrate-Biased ALD

A chuck system for performing a substrate-biased atomic layer deposition process that forms an electrically conductive film on a substrate includes an electrically conductive substrate holder configured to support the substrate and an electrically conductive base that supports the substrate holder....

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Bibliographic Details
Main Authors Bertuch, Adam, Sershen, Michael J
Format Patent
LanguageEnglish
Published 02.08.2018
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Summary:A chuck system for performing a substrate-biased atomic layer deposition process that forms an electrically conductive film on a substrate includes an electrically conductive substrate holder configured to support the substrate and an electrically conductive base that supports the substrate holder. An electrical isolating layer is sandwiched between the substrate holder and the base. The electrical isolating layer has an outer end and an edge recess formed in and that runs around the outer edge. The edge recess is configured to prevent the electrically conductive film from coating the entire interior of the edge recess, thereby maintaining electrical isolation between the substrate holder and the base.
Bibliography:Application Number: US201815877809