SELF-ALIGNED VIA FORMING TO CONDUCTIVE LINE AND RELATED WIRING STRUCTURE
A method of forming a via and a wiring structure formed are disclosed. The method may include forming a conductive line in a first dielectric layer; forming a hard mask adjacent to the conductive line after the conductive line forming; forming a second dielectric layer over the hard mask; and formin...
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Main Authors | , |
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Format | Patent |
Language | English |
Published |
26.07.2018
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Subjects | |
Online Access | Get full text |
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Summary: | A method of forming a via and a wiring structure formed are disclosed. The method may include forming a conductive line in a first dielectric layer; forming a hard mask adjacent to the conductive line after the conductive line forming; forming a second dielectric layer over the hard mask; and forming a via opening to the conductive line in the second dielectric layer. The via opening lands at least partially on the hard mask to self-align the via opening to the conductive line. A via may be formed by filling the via opening with a conductor. |
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Bibliography: | Application Number: US201815933449 |