SYSTEM AND METHOD FOR DETECTING ANOMALIES IN A COMPONENT

An inspection system for inspecting a component is presented. The inspection system includes a probe unit, wherein the probe unit includes a first flux concentrator operatively coupled to a first surface of the component. Also, the probe unit includes at least one inductive coil positioned around th...

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Bibliographic Details
Main Authors Gustavsson, Jonas Patrik Richard, Hawes, Nathaniel Benedict, Underwood, Sara Saxton, Moscinski, Michael Colan
Format Patent
LanguageEnglish
Published 26.04.2018
Subjects
CALCULATING
COLORIMETRY
COMPUTING
COUNTING
ELECTRIC COMMUNICATION TECHNIQUE
ELECTRICITY
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT
MEASURING
PHYSICS
PICTORIAL COMMUNICATION, e.g. TELEVISION
RADIATION PYROMETRY
TESTING
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Summary:An inspection system for inspecting a component is presented. The inspection system includes a probe unit, wherein the probe unit includes a first flux concentrator operatively coupled to a first surface of the component. Also, the probe unit includes at least one inductive coil positioned around the first flux concentrator, and configured to induce an electrical current flow in at least a portion of the component via the first flux concentrator. Further, the inspection system includes an infrared (IR) camera configured to capture a plurality of frames corresponding to the portion of the component. In addition, the inspection system includes a processing unit electrically coupled to the IR camera and configured to determine an anomaly in the component based on the captured plurality of frames.
Bibliography:Application Number: US201615334413