ZONE SELECTIVE INTERLOCKING TEST APPARATUS

A ZSI testing apparatus includes a fault generation circuit, a plurality of cable assemblies coupled to the fault generation circuit, wherein the cable assemblies are structured to be selectively coupled to selected circuit interrupters, a human machine interface, and a controller coupled. The contr...

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Bibliographic Details
Main Author BURKLE ALEC DANE
Format Patent
LanguageEnglish
Published 05.04.2018
Subjects
CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
ELECTRICITY
EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS
GENERATION
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:A ZSI testing apparatus includes a fault generation circuit, a plurality of cable assemblies coupled to the fault generation circuit, wherein the cable assemblies are structured to be selectively coupled to selected circuit interrupters, a human machine interface, and a controller coupled. The controller is configured to: (i) selectively cause a fault current to be provided to a number of the cable assemblies, (ii) receive an input from each circuit interrupter that is coupled to one of the cable assemblies, each input being indicative of a trip signal output of the circuit interrupter, (iii) determine based on the received inputs (a) that an error has occurred with respect to operation of the circuit interrupters and (b) a recommendation for fixing the error, and (iv) cause an output indicative of the error and the recommendation to be provided on the human machine interface.
Bibliography:Application Number: US201715831656