ELECTROSTATIC DISCHARGE PROTECTION DEVICE

An ESD protection device includes a semiconductor substrate of p-type conductivity, an epitaxial layer of p-type conductivity, a buried layer of n-type conductivity, device isolation layers, a first well of n-type conductivity, an emitter formed by implanting p-type impurities into an upper portion...

Full description

Saved in:
Bibliographic Details
Main Authors PARK Woo Suk, HAN Jung Woo, KIM Jong Min
Format Patent
LanguageEnglish
Published 22.03.2018
Subjects
Online AccessGet full text

Cover

Loading…
Abstract An ESD protection device includes a semiconductor substrate of p-type conductivity, an epitaxial layer of p-type conductivity, a buried layer of n-type conductivity, device isolation layers, a first well of n-type conductivity, an emitter formed by implanting p-type impurities into an upper portion of the first well, a second well of p-type conductivity, a collector formed by implanting p-type impurities into an upper portion of the second well, a first P-body region interposed between the second well and the collector, a third well of n-type conductivity, a base formed by implanting n-type impurities into an upper surface portion of the third well, and a first deep well of n-type conductivity, interposed between the third well and the buried layer.
AbstractList An ESD protection device includes a semiconductor substrate of p-type conductivity, an epitaxial layer of p-type conductivity, a buried layer of n-type conductivity, device isolation layers, a first well of n-type conductivity, an emitter formed by implanting p-type impurities into an upper portion of the first well, a second well of p-type conductivity, a collector formed by implanting p-type impurities into an upper portion of the second well, a first P-body region interposed between the second well and the collector, a third well of n-type conductivity, a base formed by implanting n-type impurities into an upper surface portion of the third well, and a first deep well of n-type conductivity, interposed between the third well and the buried layer.
Author HAN Jung Woo
KIM Jong Min
PARK Woo Suk
Author_xml – fullname: PARK Woo Suk
– fullname: HAN Jung Woo
– fullname: KIM Jong Min
BookMark eNrjYmDJy89L5WTQdPVxdQ4J8g8OcQzxdFZw8Qx29nAMcndVCAjyDwHKePr7Kbi4hnk6u_IwsKYl5hSn8kJpbgZlN9cQZw_d1IL8-NTigsTk1LzUkvjQYCMDQwsDCyNLSxNHQ2PiVAEAyLEnTw
ContentType Patent
DBID EVB
DatabaseName esp@cenet
DatabaseTitleList
Database_xml – sequence: 1
  dbid: EVB
  name: esp@cenet
  url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
Discipline Medicine
Chemistry
Sciences
ExternalDocumentID US2018082994A1
GroupedDBID EVB
ID FETCH-epo_espacenet_US2018082994A13
IEDL.DBID EVB
IngestDate Fri Jul 19 15:15:02 EDT 2024
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language English
LinkModel DirectLink
MergedId FETCHMERGED-epo_espacenet_US2018082994A13
Notes Application Number: US201715707563
OpenAccessLink https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20180322&DB=EPODOC&CC=US&NR=2018082994A1
ParticipantIDs epo_espacenet_US2018082994A1
PublicationCentury 2000
PublicationDate 20180322
PublicationDateYYYYMMDD 2018-03-22
PublicationDate_xml – month: 03
  year: 2018
  text: 20180322
  day: 22
PublicationDecade 2010
PublicationYear 2018
RelatedCompanies DONGBU HITEK CO., LTD
RelatedCompanies_xml – name: DONGBU HITEK CO., LTD
Score 3.1329746
Snippet An ESD protection device includes a semiconductor substrate of p-type conductivity, an epitaxial layer of p-type conductivity, a buried layer of n-type...
SourceID epo
SourceType Open Access Repository
SubjectTerms BASIC ELECTRIC ELEMENTS
CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS
GENERATION
SEMICONDUCTOR DEVICES
Title ELECTROSTATIC DISCHARGE PROTECTION DEVICE
URI https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20180322&DB=EPODOC&locale=&CC=US&NR=2018082994A1
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfR3LSsNAcChV1JtWxWqVgBLwEEzzXA9B0s3GRGwT8ii9lW6TgCC12Ii_72Rttafedndg9sHOa-exAHeaalb2XC2U0qwqxbBNS-GP3FYKQ9d5RUy8Mo1Hdziygtx4mZiTFrxvcmFEndBvURwRKWqO9F4Lfr38f8TyRGzl6oG_4dDHk585nry2jvtExQsqewOHxZEXUZlSJ0_lUfILI8h7DRdtpT1UpG1hto0HTV7Kcluo-MewHyO-RX0CrXLRgUO6-XutAwfDtcsbm2vqW53CPXtlNEuiNHOzkEpemNLATZ6ZFCdRxkQ0iOSxcUjZGdz6LKOBgnNO_7Y4zdPtBern0Ebjv7wAqdBIRfqoUxmNy00tyGxmcW4aNm8q71VqF3q7MF3uBl_BUdNtYqo0rQft-vOrvEYhW_MbcTY_5zF6sA
link.rule.ids 230,309,783,888,25577,76883
linkProvider European Patent Office
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfR1NT8Iw9IWgEW-KGlHUJZolHhbH2Fg9LAa6zk2Bka0QbgtlW2JikMiMf9-3CsqJW9OXvH7kffZ9FODO0K3cnuuplll5rpm21dHEo7C11Gy3RU4sJJkyojsYdvyx-TK1phV439TCyD6h37I5InLUHPm9kPJ6-f-I5crcytWDeMOpjyePO6669o5bREcCVd2ew0ahG1KVUmccq8PoF0ZQ9ppd9JX20Mgm0lma9Mq6lOW2UvGOYH-E-BbFMVSyRR1qdPP3Wh0OBuuQNw7X3Lc6gXvWZ5RHYcy7PKCKG8TU70bPTBlFIWcyG0Rx2SSg7BRuPcapr-Gayd8Rk3G8vcH2GVTR-c_OQUkNkpMW2lRmGXLTUzKbdYSwTFuUnfdyvQHNXZgudoNvoObzQT_pB8PXSzgsQWV-lWE0oVp8fmVXqHALcS3v6QfPsX2g
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=ELECTROSTATIC+DISCHARGE+PROTECTION+DEVICE&rft.inventor=PARK+Woo+Suk&rft.inventor=HAN+Jung+Woo&rft.inventor=KIM+Jong+Min&rft.date=2018-03-22&rft.externalDBID=A1&rft.externalDocID=US2018082994A1