ELECTRICAL INSPECTION METHOD FOR SOLAR CELLS

The present invention discloses an electrical inspection method for solar cells, comprising steps of supplying a voltage and a current to a solar cell for stimulating the solar cell and giving a ray of light; filtering the light to give a ray of light having a predetermined wavelength; and measuring...

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Bibliographic Details
Main Authors CHEN CHUN-YI, LEE YUEH-MU, HONG HWEN-FEN, SHIH ZUN-HAO
Format Patent
LanguageEnglish
Published 08.03.2018
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Summary:The present invention discloses an electrical inspection method for solar cells, comprising steps of supplying a voltage and a current to a solar cell for stimulating the solar cell and giving a ray of light; filtering the light to give a ray of light having a predetermined wavelength; and measuring an optical power value of the light having a predetermined wavelength. The electrical inspection method adopts a low-cost apparatus to replace the solar simulators according to the prior art. In addition to saving costly equipment, filter adjustment, and the maintenance fee for replacing lamps, the defect inspection flow for solar cells can be further integrated and hence improving the efficiency.
Bibliography:Application Number: US201615258339