MEASUREMENT PARAMETERS FOR QC METROLOGY OF SYNTHETICALLY GENERATED DIAMOND WITH NV CENTERS

A system measures the quantum energy levels of a diamond nitrogen vacancy (DNV) material to provide information regarding the quality of the material. The measurements may provide information regarding the degree of strain in the crystal lattice of the material, the concentration of crystal defect i...

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Bibliographic Details
Main Author Cammerata Jeff D
Format Patent
LanguageEnglish
Published 27.07.2017
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING ELECTRIC VARIABLES
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:A system measures the quantum energy levels of a diamond nitrogen vacancy (DNV) material to provide information regarding the quality of the material. The measurements may provide information regarding the degree of strain in the crystal lattice of the material, the concentration of crystal defect in the material, the concentration of nitrogen vacancy (NV) centers in the material, or the concentration of impurities in the material. The system may be employed to perform quality control checks on the properties of the DNV material quickly and non-destructively.
Bibliography:Application Number: US201615003577