Test Pin Configuration for Test Device for Testing Devices Under Test
A test pin for a test device for electrically contacting a device under test to be tested, wherein the test pin comprises an electrically conductive base structure for electrically conducting a test signal between the device under test and the test device, and an exchangeable electrically conductive...
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Main Authors | , , , , , , , , , , |
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Format | Patent |
Language | English |
Published |
22.06.2017
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Subjects | |
Online Access | Get full text |
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Summary: | A test pin for a test device for electrically contacting a device under test to be tested, wherein the test pin comprises an electrically conductive base structure for electrically conducting a test signal between the device under test and the test device, and an exchangeable electrically conductive pin tip body configured to directly contact the device under test and to be exchangeably assembled with the base structure. |
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Bibliography: | Application Number: US201514970868 |