Modular Atomic Force Microscope with Environmental Controls
A modular Atomic Force Microscope that allows ultra-high resolution imaging and measurements in a wide variety of environmental conditions is described. The instrument permits such imaging and measurements in environments ranging from ambient to liquid or gas or extremely high or extremely low tempe...
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Format | Patent |
Language | English |
Published |
15.06.2017
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Online Access | Get full text |
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Abstract | A modular Atomic Force Microscope that allows ultra-high resolution imaging and measurements in a wide variety of environmental conditions is described. The instrument permits such imaging and measurements in environments ranging from ambient to liquid or gas or extremely high or extremely low temperatures. |
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AbstractList | A modular Atomic Force Microscope that allows ultra-high resolution imaging and measurements in a wide variety of environmental conditions is described. The instrument permits such imaging and measurements in environments ranging from ambient to liquid or gas or extremely high or extremely low temperatures. |
Author | Cleveland Jason Hodgson Jim Proksch Roger Viani Mario Rutgers Maarten |
Author_xml | – fullname: Viani Mario – fullname: Cleveland Jason – fullname: Rutgers Maarten – fullname: Proksch Roger – fullname: Hodgson Jim |
BookMark | eNrjYmDJy89L5WSw9s1PKc1JLFJwLMnPzUxWcMsvSk5V8M1MLsovTs4vSFUozyzJUHDNK8ssys_LTc0rScxRcM7PKynKzynmYWBNS8wpTuWF0twMym6uIc4euqkF-fGpxQWJyal5qSXxocFGBobmhmYWBhaWjobGxKkCAINXMk4 |
ContentType | Patent |
DBID | EVB |
DatabaseName | esp@cenet |
DatabaseTitleList | |
Database_xml | – sequence: 1 dbid: EVB name: esp@cenet url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP sourceTypes: Open Access Repository |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Medicine Chemistry Sciences Physics |
ExternalDocumentID | US2017168089A1 |
GroupedDBID | EVB |
ID | FETCH-epo_espacenet_US2017168089A13 |
IEDL.DBID | EVB |
IngestDate | Fri Jul 19 16:08:47 EDT 2024 |
IsOpenAccess | true |
IsPeerReviewed | false |
IsScholarly | false |
Language | English |
LinkModel | DirectLink |
MergedId | FETCHMERGED-epo_espacenet_US2017168089A13 |
Notes | Application Number: US201715445779 |
OpenAccessLink | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20170615&DB=EPODOC&CC=US&NR=2017168089A1 |
ParticipantIDs | epo_espacenet_US2017168089A1 |
PublicationCentury | 2000 |
PublicationDate | 20170615 |
PublicationDateYYYYMMDD | 2017-06-15 |
PublicationDate_xml | – month: 06 year: 2017 text: 20170615 day: 15 |
PublicationDecade | 2010 |
PublicationYear | 2017 |
RelatedCompanies | Oxford Instruments Asylum Research, Inc |
RelatedCompanies_xml | – name: Oxford Instruments Asylum Research, Inc |
Score | 3.0985172 |
Snippet | A modular Atomic Force Microscope that allows ultra-high resolution imaging and measurements in a wide variety of environmental conditions is described. The... |
SourceID | epo |
SourceType | Open Access Repository |
SubjectTerms | APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM] MEASURING PHYSICS SCANNING-PROBE TECHNIQUES OR APPARATUS TESTING |
Title | Modular Atomic Force Microscope with Environmental Controls |
URI | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20170615&DB=EPODOC&locale=&CC=US&NR=2017168089A1 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1bS8MwFD6MeX3TqniZElD6VmxN27RIka0XhtBtuFX2NpKsBWG0Y634903i5va0x5xAOAk5Obl83xeAp4IXDrMxMRhhtiEmhWtQk5rGCyWEeExsKQql9jlw-5n9PnWmLVhsuDBKJ_RHiSOKiOIi3hu1Xi-3l1iRwlbWz-xLmKq3ZBJE-vp0LLVgLEePekE8GkbDUA_DIBvrgw9VZ8lvJvyuOCsdyI20VNqPP3uSl7LcTSrJGRyORHtlcw6tvNTgJNz8vabBcbp-8tbgSGE0eS2M6zisL-A1reYSP4q6jWQVo6Ra8RylElynaCZIXq-ieEtiowsU_oHS60t4TOJJ2DeEP7P_7s-y8a7z-AraZVXm14Cohy3scSwSDLEZIdTnds4LH9ueyV0yv4HOvpZu91ffwaksSliU5XSg3ay-83uRgBv2oMbtF_nTiOA |
link.rule.ids | 230,309,786,891,25594,76903 |
linkProvider | European Patent Office |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3dS8MwED_G_JhvOhU_pgaUvhVb-5EWGbK1K1PXbrhW9laarAVhtGOt-O-bxM7taa85CJeQy-Uuv98dwENGM4PoGpYJJrrMDoUpJ0qiyE8Jxtgi7EmRiWqfgTmM9LeZMWvAYs2FEXVCf0RxRGZRlNl7Je7r5SaJ5QpsZflIvthQ8eKFXVeqo2NeC0Y1JLffHUzG7tiRHKcbTaXgQ8hU3mbC7rFYaQ-zoFAES599zktZbjsV7xj2J2y-vDqBRpq3oeWse6-14dCvv7zbcCAwmrRkg7Udlqfw7Bdzjh9FvYqzipFXrGiKfA6uEzQTxNOraLAhsSUL5PyB0sszuPcGoTOUmT7x__LjaLqtvHYOzbzI0wtAiaWpmkU15mCwTjBObKqnNLM13VKoieeX0Nk109Vu8R20hqE_ikevwfs1HHERh0ipRgea1eo7vWHOuCK3Yg9_AYVQi8o |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=Modular+Atomic+Force+Microscope+with+Environmental+Controls&rft.inventor=Viani+Mario&rft.inventor=Cleveland+Jason&rft.inventor=Rutgers+Maarten&rft.inventor=Proksch+Roger&rft.inventor=Hodgson+Jim&rft.date=2017-06-15&rft.externalDBID=A1&rft.externalDocID=US2017168089A1 |