Modular Atomic Force Microscope with Environmental Controls
A modular Atomic Force Microscope that allows ultra-high resolution imaging and measurements in a wide variety of environmental conditions is described. The instrument permits such imaging and measurements in environments ranging from ambient to liquid or gas or extremely high or extremely low tempe...
Saved in:
Main Authors | , , , , |
---|---|
Format | Patent |
Language | English |
Published |
15.06.2017
|
Subjects | |
Online Access | Get full text |
Cover
Loading…
Summary: | A modular Atomic Force Microscope that allows ultra-high resolution imaging and measurements in a wide variety of environmental conditions is described. The instrument permits such imaging and measurements in environments ranging from ambient to liquid or gas or extremely high or extremely low temperatures. |
---|---|
Bibliography: | Application Number: US201715445779 |