HIGH DEFINITION EEG

A method, apparatus and system for measuring electrical activity generated within a brain is disclosed. A headpiece having a first transistor is placed in contact with a head that contains the brain to bring the first transistor into electrical contact with the head. An electronic signal is generate...

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Bibliographic Details
Main Authors Hsueh Pei-Yun S, Cahan Amos, Deligianni Hariklia
Format Patent
LanguageEnglish
Published 15.06.2017
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Summary:A method, apparatus and system for measuring electrical activity generated within a brain is disclosed. A headpiece having a first transistor is placed in contact with a head that contains the brain to bring the first transistor into electrical contact with the head. An electronic signal is generated at the first transistor in response to the electrical activity generated within the brain. The electronic signal is processed at the headpiece in order to measure the electrical activity.
Bibliography:Application Number: US201514969856