Sensor arrangement for combine harvester

A sensor for measuring a thickness of a layer of a grain/residue mixture as the layer is transported through a cleaning arrangement of a combine harvester. The sensor is mounted on a support surface of a grain pan or a sieve of the cleaning arrangement and comprises a tower-shaped support structure...

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Bibliographic Details
Main Author Moutton Bart
Format Patent
LanguageEnglish
Published 01.06.2017
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Summary:A sensor for measuring a thickness of a layer of a grain/residue mixture as the layer is transported through a cleaning arrangement of a combine harvester. The sensor is mounted on a support surface of a grain pan or a sieve of the cleaning arrangement and comprises a tower-shaped support structure with sensor elements attached to the structure and forming a vertical stack of sensor elements, so that a number of sensor elements is submerged in the layer and a number of sensor elements extends above the layer. The sensor elements are configured to measure an electrical property that changes as a function of immediate surroundings of the sensor elements. The sensor elements are configured to be read out independently from each other.
Bibliography:Application Number: US201515313427