DIAGNOSIS APPARATUS AND METHOD FOR DETECTING A DEFECT OF AT LEAST ONE OF A PLURALITY OF LIGHT EMITTING DIODES

The invention relates to a diagnosis apparatus for detecting a defect of at least one of a plurality of light emitting diodes which are interconnected to form a light emitting diode series connecting a first supply terminal to a second supply terminal. The defect is intended to be detected with litt...

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Bibliographic Details
Main Authors Brejcha Philipp, Austerer Maximilian, Koellner Wolfgang
Format Patent
LanguageEnglish
Published 11.05.2017
Subjects
ELECTRIC HEATING
ELECTRIC LIGHTING NOT OTHERWISE PROVIDED FOR
ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:The invention relates to a diagnosis apparatus for detecting a defect of at least one of a plurality of light emitting diodes which are interconnected to form a light emitting diode series connecting a first supply terminal to a second supply terminal. The defect is intended to be detected with little wiring outlay. The invention provides that a resistance element is connected in parallel with each light emitting diode and a measuring device is configured to generate a diagnosis current between the two supply terminals in a luminous pause, during which none of the light emitting diodes emit light, said diagnosis current giving rise, at each resistance element, to a voltage lower than a forward voltage, starting from which the light emitting diode respectively connected in parallel emits light, and to provide a voltage value of a diagnosis voltage dropped between the supply terminals.
Bibliography:Application Number: US201615294026