CONTACTING SOI SUBSTRATES

An integrated circuit is provided including a semiconductor bulk substrate, a buried oxide layer formed on the semiconductor bulk substrate, a plurality of cells, each cell having a transistor device, formed over the buried oxide layer, a plurality of gate electrode lines running through the cells a...

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Bibliographic Details
Main Authors Lorenz Ingolf, Jain Navneet, Zier Michael, Haufe Christian, Hensel Ulrich Gerhard
Format Patent
LanguageEnglish
Published 13.04.2017
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Summary:An integrated circuit is provided including a semiconductor bulk substrate, a buried oxide layer formed on the semiconductor bulk substrate, a plurality of cells, each cell having a transistor device, formed over the buried oxide layer, a plurality of gate electrode lines running through the cells and providing gate electrodes for the transistor devices of the cells, and a plurality of tap cells configured for electrically contacting the semiconductor bulk substrate and arranged at positions different from positions below or above the plurality of cells having the transistor devices.
Bibliography:Application Number: US201615375890