TIME OF FLIGHT MASS SPECTROMETER

A time of flight ("TOF") mass spectrometer including: an ion source configured to produce ions having a plurality of m/z values; a detector for detecting ions produced by the ion source; a tilt correction device located along a portion of a reference ion flight path extending from the ion...

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Bibliographic Details
Main Authors GILES Roger, GILL Matthew, STEWART Hamish Ian
Format Patent
LanguageEnglish
Published 06.04.2017
Subjects
BASIC ELECTRIC ELEMENTS
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
ELECTRICITY
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Summary:A time of flight ("TOF") mass spectrometer including: an ion source configured to produce ions having a plurality of m/z values; a detector for detecting ions produced by the ion source; a tilt correction device located along a portion of a reference ion flight path extending from the ion source to a planar surface of the detector; wherein the tilt correction device includes tilt correction electrodes configured to generate at least one dipole electric field across the reference ion flight path, the at least one dipole electric field being configured to tilt an isochronous plane of ions produced by the ion source so as to correct a previous angular misalignment between the isochronous plane and the planar surface of the detector.
Bibliography:Application Number: US201615276876