SOCKET APPARATUS FOR SEMICONDUCTOR DEVICE TEST

• Main Authors: HWANG Dong Weon, Hwang Jae Suk, HWANG Jae Baek
• Format: Patent
• Language: English
• Published: 16.02.2017
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

Disclosed a socket apparatus for a semiconductor device test, the apparatus including: body elements (100, 200) into which contacts (400) are inserted; movable elements (300, 500) on which a semiconductor device (IC) is seated; a socket cover (600) assembled to the movable elements (300, 500) and re...